Definition: Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM is instrumental in the analysis and ...

SUWON, South Korea, Nov. 12, 2024 /PRNewswire/ -- Park Systems, a global leader in atomic force microscopy (AFM), announced ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid ...

A geared stepper motor attached to the probe platform is set up to allow ... Continue reading “Building A 3D Printed Scanning Tunneling Microscope” → ...

Scanning Tunneling Microscopy is a subset of Scanning Probe Microscopy (SPM), a group of techniques that image and manipulate surfaces at the nanometer to atomic scales. SPM techniques share the ...

In a recent article, researchers analyzed defect structures in monolayer graphene and hexagonal boron nitride using STEM ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

The Electron and Scanning Probe Microscopy Unit provides solutions for imaging and analysis at the nanoscale. The unit houses two scanning electron microscopes, two scanning probe microscopes and ...

Research provides a deeper understanding of precisely what is happening in organic solar cells as light is converted into electricity. Researchers developed a new method which visualizes interfaces ...

Microscopy refers to any method used to acquire ... or through the use of a physical scanning probe that measures one of a wide range of different sample characteristics. Direct visualization ...